%0 Journal Article
%A Sekhar Yadav, G.V.P. Chandra , Ghali, V. S. ,  Suresh, B., Baloji, Naik R. 
%T Defect Detection using Depth Resolvable Statistical Post Processing in Non-Stationary Thermal Wave Imaging
%J Journal of Information Systems and Telecommunication (JIST) 
%V 10
%N 38
%P 132-140
%D 2022
%R 10.52547/jist.15690.10.38.132
%U https://rimag.ir/fa/Article/15690