تولید خودکار آزمون برای مدارهای دیجیتال ترکیبی با بهکارگیری شاخص ردیابی تقریبی مسیر بحرانی با الگوهای موازی
الموضوعات : electrical and computer engineeringزینب مرادی قیسوندی 1 , آرزو کامران 2
1 - دانشكده مهندسي برق و کامپیوتر، دانشگاه رازی، کرمانشاه، ایران
2 - دانشكده مهندسي برق و کامپیوتر، دانشگاه رازی، کرمانشاه، ایران
الکلمات المفتاحية: شبیهسازی اشکال, تولید خودکار آزمون برای مدارهای دیجیتال, پوشش اشکال, الگوی آزمون, ردگیری تقریبی مسیر بحرانی.,
ملخص المقالة :
در این مطالعه، روشی برای تولید آزمون برای مدارهای دیجیتال ترکیبی ارائه شده است که از شاخص حاصل از روش ردیابی تقریبی مسیر بحرانی برای شناسایی بردارهای آزمون کارا استفاده میکند. نتایج ارزیابیها در مدارهای محک نشان میدهد که شاخص حاصل از این روش تقریبی دارای همبستگی قوی با شاخص دقیق پوشش اشکال است و ضمناً پیچیدگی محاسباتی آن بسیار کمتر از روش دقیق است. با استفاده از روش پیشنهادی، برای تعدادی از مدارهای محک، مجموعه آزمون تولید شده و نتایج آن با سایر روشهای تولید آزمون که از شاخص دقیق پوشش اشکال یا شاخصهای تقریبی دیگر مانند شاخص احتمالاتی یا شاخص حاصل از شبیهسازی با نمونهبرداری اشکال استفاده میکنند، مقایسه شده است. نتایج این مقایسه، کارایی روش آزمون پیشنهادی را از نظر پوشش اشکال، تعداد بردارهای آزمون، و زمان تولید آزمون تأیید میکند.
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